High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction
Titel:
High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction
Auteur:
Hammarberg, Susanna Dagytė, Vilgailė Chayanun, Lert Hill, Megan O. Wyke, Alexander Björling, Alexander Johansson, Ulf Kalbfleisch, Sebastian Heurlin, Magnus Lauhon, Lincoln J. Borgström, Magnus T. Wallentin, Jesper