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Journal description
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Details for article 18 of 23 found articles
| Title: |
Remote sensing: A technology for assessment of sugarcane crop acreage and yield |
| Author: |
Rao, P. V. Krishna Rao, V. Venkateswara Venkataratnam, L. |
| Appeared in: |
Sugar tech |
| Paging: | Volume 4 (1999) nr. 3-4 pages 97-101 |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Springer India, New Delhi |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 23 found articles
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