Multi-environment Analysis of Yield and Quality Traits in Sugarcane (Saccharum sp.) through AMMI and GGE Biplot Analysis
Titel:
Multi-environment Analysis of Yield and Quality Traits in Sugarcane (Saccharum sp.) through AMMI and GGE Biplot Analysis
Auteur:
Vinu, V. Alarmelu, S. Elayaraja, K. Appunu, C. Hemaprabha, G. Parthiban, S. Shanmugasundaram, K. Rajamadhan, R. Saravanan, K. G. Kathiravan, S. Ram, Bakshi Vinayaka, V. Varatharaj, M. K. C.