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                                       Details for article 22 of 57 found articles
 
 
  Effect of conditioner load on the polishing pad surface during chemical mechanical planarization process
 
 
Title: Effect of conditioner load on the polishing pad surface during chemical mechanical planarization process
Author: Shin, Cheolmin
Qin, Hongyi
Hong, Seokjun
Jeon, Sanghyuk
Kulkarni, Atul
Kim, Taesung
Appeared in: Journal of mechanical science and technology
Paging: Volume 30 (2016) nr. 12 pages 5659-5665
Year: 2016
Contents:
Publisher: Korean Society of Mechanical Engineers, Seoul
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 57 found articles
 
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