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  Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties
 
 
Title: Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties
Author: Mamedov, G. A.
Godzhaev, E. M.
Magerramov, A. M.
Zeinalov, Sh. A.
Appeared in: Surface engineering and applied electrochemistry
Paging: Volume 47 (2011) nr. 6 pages 565-569
Year: 2011
Contents:
Publisher: Allerton Press, Inc., Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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