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                                       Details for article 12 of 32 found articles
 
 
  Electron Microscopy and Electron Energy Loss Spectroscopy of Thin Titanium Nitride Films in the TiNx/La:HfO2(Hf0.5Zr0.5O2)/TiNx/SiO2 System
 
 
Title: Electron Microscopy and Electron Energy Loss Spectroscopy of Thin Titanium Nitride Films in the TiNx/La:HfO2(Hf0.5Zr0.5O2)/TiNx/SiO2 System
Author: Suvorova, E. I.
Uvarov, O. V.
Klimenko, A. A.
Chizh, K. V.
Appeared in: Bulletin of the Russian Academy of Sciences. Physics
Paging: Volume 87 () nr. 10 pages 1466-1472
Year: 2023-10-23
Contents:
Publisher: Pleiades Publishing, Moscow
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 32 found articles
 
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