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                                       Details for article 3 of 23 found articles
 
 
  Correlation between Defect Structure and the Strength Properties of Silicon for Various Means of Plastic Deformation
 
 
Title: Correlation between Defect Structure and the Strength Properties of Silicon for Various Means of Plastic Deformation
Author: Velikhanov, A. R.
Appeared in: Bulletin of the Russian Academy of Sciences. Physics
Paging: Volume 83 (2019) nr. 10 pages 1210-1213
Year: 2019
Contents:
Publisher: Pleiades Publishing, Moscow
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 23 found articles
 
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