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Details for article 20 of 34 found articles
| Title: |
Particulars of studying the roughness of substrates for multilayer X-ray optics using small-angle X-ray reflectometry, atomic-force, and interference microscopy |
| Author: |
Barysheva, M. M. Vainer, Yu. A. Gribkov, B. A. Zorina, M. V. Pestov, A. E. Rogachev, D. N. Salashchenko, N. N. Chkhalo, N. I. |
| Appeared in: |
Bulletin of the Russian Academy of Sciences. Physics |
| Paging: | Volume 75 (2011) nr. 1 pages 67-72 |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Allerton Press, Inc., Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 34 found articles
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