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Journal description
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Details for article 17 of 38 found articles
| Title: |
Investigation of Ge and C layer deposition on a Si substrate using SIMS profiling |
| Author: |
Kharlamov, V. S. Kulikov, D. V. Trushin, Yu. V. Nader, P. Mazri, P. Stauden, Th. Pezoldt, J. |
| Appeared in: |
Bulletin of the Russian Academy of Sciences. Physics |
| Paging: | Volume 74 (2010) nr. 2 pages 241-244 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Allerton Press, Inc., Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 38 found articles
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