|
Quantifying the Crack-Tip Residual Stress of Nickel-Based Single-Crystal Alloys at the Micron Scale by Focused Ion Beam and Digital Image Correlation |
|
|
|
Titel: |
Quantifying the Crack-Tip Residual Stress of Nickel-Based Single-Crystal Alloys at the Micron Scale by Focused Ion Beam and Digital Image Correlation |
Auteur: |
Niu, Haoyi Sun, Wei Li, Rengeng Miao, Kesong Xia, Yiping Liu, Chenglu Li, Xuewen Wu, Hao Liu, Qing Fan, Guohua |
Verschenen in: |
Metallurgical and materials transactions. A, Physical metallurgy and materials science |
Paginering: |
Jaargang 54 () nr. 11 pagina's 4215-4221 |
Jaar: |
2023-09-02 |
Inhoud: |
|
Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|