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Details for article 20 of 41 found articles
| Title: |
In Situ Electron Diffraction and Resistivity Characterization of Solid State Reaction Process in Cu/Al Bilayer Thin Films |
| Author: |
Moiseenko, Evgeny T. Altunin, Roman R. Zharkov, Sergey M. |
| Appeared in: |
Metallurgical and materials transactions. A, Physical metallurgy and materials science |
| Paging: | Volume 51 () nr. 3 pages 1428-1436 |
| Year: |
2020-01-06 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 41 found articles
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