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                                       Details for article 22 of 34 found articles
 
 
  Microstructural Characterization of Ti-6Al-4V Metal Chips by Focused Ion Beam and Transmission Electron Microscopy
 
 
Title: Microstructural Characterization of Ti-6Al-4V Metal Chips by Focused Ion Beam and Transmission Electron Microscopy
Author: Schneider, Judy
Dong, Lei
Howe, Jane Y.
Meyer, Harry M.
Appeared in: Metallurgical and materials transactions. A, Physical metallurgy and materials science
Paging: Volume 42 (2011) nr. 11 pages 3527-3533
Year: 2011
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 34 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands