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Journal description
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Details for article 1 of 24 found articles
| Title: |
A critical comparison of on-line coupling IC-ICP-(AES, MS) with competing analytical methods for ultra trace analysis of microelectronic materials |
| Author: |
Seubert, Andreas |
| Appeared in: |
Fresenius' journal of analytical chemistry |
| Paging: | Volume 364 (1999) nr. 5 pages 404-409 |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 24 found articles
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