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Journal description
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Details for article 67 of 69 found articles
| Title: |
Thin film analysis in the nanometer scale |
| Author: |
Wetzig, K. Bauer, Hans-Dietrich |
| Appeared in: |
Fresenius' journal of analytical chemistry |
| Paging: | Volume 355 (1996) nr. 5-6 pages 447-451 |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 67 of 69 found articles
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