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Journal description
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Details for article 6 of 44 found articles
| Title: |
A robust method to measure residual stress in micro-structure |
| Author: |
Kang, Yi-Ian Qiu, Wei Lei, Zhen-kun |
| Appeared in: |
Optoelectronics letters |
| Paging: | Volume 3 (2007) nr. 2 pages 126-128 |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Tianjin University of Technology, Tianjin |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 44 found articles
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