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Journal description
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Details for article 17 of 44 found articles
| Title: |
Investigation of nanometer-scale films using low angle X-ray reflectivity analysis in IPOE |
| Author: |
Wang, Zhan-shan Xu, Yao Wang, Hong-chang Zhu, Jing-tao Zhang, Zhong Wang, Feng-li Chen, Ling-yan |
| Appeared in: |
Optoelectronics letters |
| Paging: | Volume 3 () nr. 2 pages 88-90 |
| Year: |
2007-03-19 |
| Contents: | |
| Publisher: |
Tianjin University of Technology, Tianjin |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 44 found articles
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