Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction
Titel:
Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction
Auteur:
Richard, M.-I. Katcho, N. A. Proietti, M. G. Renevier, H. Favre-Nicolin, V. Zhong, Z. Chen, G. Stoffel, M. Schmidt, O. Renaud, G. Schülli, T. U. Bauer, G.