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Journal description
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Details for article 10 of 20 found articles
| Title: |
Core-unified soc test data compression and application |
| Author: |
Yi, Maoxiang Guo, Xueying Liang, Huaguo Wang, Wei Zhang, Lei |
| Appeared in: |
Journal of electronics (China) |
| Paging: | Volume 27 (2010) nr. 1 pages 79-87 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
SP Science Press, Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 20 found articles
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