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Journal description
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Details for article 3 of 16 found articles
| Title: |
Analysis of circuit tolerance based on random set theory |
| Author: |
Xu, Xiaobin Wen, Chenglin |
| Appeared in: |
Journal of electronics (China) |
| Paging: | Volume 25 (2008) nr. 6 pages 852-859 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 16 found articles
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