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Journal description
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Details for article 11 of 27 found articles
| Title: |
Circuit testable design and universal test sets for multiple-valued logic functions |
| Author: |
Pan, Zhongliang |
| Appeared in: |
Journal of electronics (China) |
| Paging: | Volume 24 (2007) nr. 1 pages 138-144 |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Science Press, Beijing |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 27 found articles
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