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Journal description
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Details for article 2 of 18 found articles
| Title: |
A new image quality assessment based on HVS |
| Author: |
Du, Juan Yu, Yinglin Xie, Shengli |
| Appeared in: |
Journal of electronics (China) |
| Paging: | Volume 22 (2005) nr. 3 pages 315-320 |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Science Press, Beijing |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
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