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Journal description
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Details for article 11 of 16 found articles
| Title: |
Investigation of charge intensification effect in a-Si:H by means of photoelectric sensitivity method |
| Author: |
Hai, Yuhan Hai, Hao Xi, Zhonghe Zhang, Qiang |
| Appeared in: |
Journal of electronics (China) |
| Paging: | Volume 16 (1999) nr. 1 pages 81-87 |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Science Press, Beijing |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 16 found articles
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