|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 42 of 73 found articles
| Title: |
Fixed Pattern Noise Analysis for Feature Descriptors in CMOS APS Images |
| Author: |
Zapata-Pérez, Juan Doménech-Asensi, Ginés Ruiz-Merino, Ramón Martínez-Álvarez, Jose Javier Fernández-Berni, Jorge Carmona-Galán, Ricardo |
| Appeared in: |
Sensing and imaging |
| Paging: | Volume 21 () nr. 1 pages xx |
| Year: |
2020-03-03 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 42 of 73 found articles
| << previous | next >> |