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Journal description
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Details for article 4 of 25 found articles
| Title: |
Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches |
| Author: |
Peschot, A. Vincent, M. Poulain, C. Mariolle, D. Houzé, F. Delamare, J. |
| Appeared in: |
Sensing and imaging |
| Paging: | Volume 16 (2015) nr. 1 pages 1-10 |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 25 found articles
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