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                                       Details for article 4 of 25 found articles
 
 
  Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches
 
 
Title: Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches
Author: Peschot, A.
Vincent, M.
Poulain, C.
Mariolle, D.
Houzé, F.
Delamare, J.
Appeared in: Sensing and imaging
Paging: Volume 16 (2015) nr. 1 pages 1-10
Year: 2015
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 25 found articles
 
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