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Constraints on Models of Electrical Transport in Optimally Doped La2−xSrxCuO4 from Measurements of Radiation-Induced Defect Resistance |
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Titel: |
Constraints on Models of Electrical Transport in Optimally Doped La2−xSrxCuO4 from Measurements of Radiation-Induced Defect Resistance |
Auteur: |
Clayhold, J. A. Pelleg, O. Ingram, D. C. Bollinger, A. T. Logvenov, G. Rench, D. W. Kerns, B. M. Schroer, M. D. Sundling, R. J. Bozovic, I. |
Verschenen in: |
Journal of superconductivity and novel magnetism |
Paginering: |
Jaargang 23 (2009) nr. 3 pagina's 339-342 |
Jaar: |
2009 |
Inhoud: |
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Uitgever: |
Springer US, Boston |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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