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Details for article 9 of 61 found articles
| Title: |
A new multiple dependent state sampling plan based on one-sided process capability indices |
| Author: |
Yen, Ching-Ho Chang, Chia-Hao Lee, Chun-Chia |
| Appeared in: |
The international journal of advanced manufacturing technology |
| Paging: | Volume 126 () nr. 7-8 pages 3297-3309 |
| Year: |
2023-03-31 |
| Contents: | |
| Publisher: |
Springer London, London |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 61 found articles
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