Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
Titel:
Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
Auteur:
Kahl, Philip Wall, Simone Witt, Christian Schneider, Christian Bayer, Daniela Fischer, Alexander Melchior, Pascal Horn-von Hoegen, Michael Aeschlimann, Martin Meyer zu Heringdorf, Frank-J.