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                                       Details for article 4 of 9 found articles
 
 
  Charging of submicron structures during silicon dioxide etching in one- and two-frequency gas discharges
 
 
Title: Charging of submicron structures during silicon dioxide etching in one- and two-frequency gas discharges
Author: Palov, A. P.
Mankelevich, Yu. A.
Rakhimova, T. V.
Shamiryan, D.
Appeared in: Plasma physics reports
Paging: Volume 36 (2010) nr. 10 pages 891-901
Year: 2010
Contents:
Publisher: SP MAIK Nauka/Interperiodica, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 9 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands