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Details for article 2 of 39 found articles
| Title: |
A Decrease in the Exchange Bias Caused by an Increase in the Effective Thickness of the Copper Layer in the NiFe/Cu/IrMn Heterostructures |
| Author: |
Morgunov, R. B. Bakhmetâev, M. V. Talantsev, A. D. |
| Appeared in: |
Physics of the solid state |
| Paging: | Volume 62 () nr. 11 pages 1991-1997 |
| Year: |
2020-11-16 |
| Contents: | |
| Publisher: |
Pleiades Publishing, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 39 found articles
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