|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 14 of 62 found articles
| Title: |
Effect of Solid-State Epitaxial Recrystallization on Defect Density in Ultrathin Silicon-on-Sapphire Layers |
| Author: |
Fedotov, S. D. Statsenko, V. N. Egorov, N. N. Golubkov, S. A. |
| Appeared in: |
Physics of the solid state |
| Paging: | Volume 61 () nr. 12 pages 2353-2358 |
| Year: |
2020-02-21 |
| Contents: | |
| Publisher: |
Pleiades Publishing, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 62 found articles
| << previous | next >> |