Erbium ion luminescence of silicon nanocrystal layers in a silicon dioxide matrix measured under strong optical excitation
Titel:
Erbium ion luminescence of silicon nanocrystal layers in a silicon dioxide matrix measured under strong optical excitation
Auteur:
Timoshenko, V. Yu. Shalygina, O. A. Lisachenko, M. G. Zhigunov, D. M. Teterukov, S. A. Kashkarov, P. K. Kovalev, D. Zacharias, M. Imakita, K. Fujii, M.