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Journal description
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Details for article 35 of 35 found articles
| Title: |
X-ray diffractometric study of the influence of a buffer layer on the microstructure of molecular-beam epitaxial InN layers of different thicknesses |
| Author: |
Ratnikov, V. V. Mamutin, V. V. Vekshin, V. A. Ivanov, S. V. |
| Appeared in: |
Physics of the solid state |
| Paging: | Volume 43 (2001) nr. 5 pages 949-954 |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Nauka/Interperiodica, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 35 found articles
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