Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy
Titel:
Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy
Auteur:
Gurevich, S. A. Zaraiskaya, T. A. Konnikov, S. G. Mikushkin, V. M. Nikonov, S. Yu. Sitnikova, A. A. Sysoev, S. E. Khorenko, V. V. Shnitov, V. V. Gordeev, Yu. S.