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                                       Details for article 6 of 10 found articles
 
 
  Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite
 
 
Title: Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite
Author: Manceau, A.
Chateigner, D.
Gates, W. P.
Appeared in: Physics and chemistry of minerals
Paging: Volume 25 (1998) nr. 5 pages 347-365
Year: 1998
Contents:
Publisher: Springer-Verlag, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 10 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands