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Journal description
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Details for article 8 of 20 found articles
| Title: |
Edge detection and characterization of digitized images |
| Author: |
Naiman, Aaron Farber, Eliav Stein, Yossi |
| Appeared in: |
Pattern analysis and applications |
| Paging: | Volume 26 () nr. 1 pages 61-72 |
| Year: |
2022-07-23 |
| Contents: | |
| Publisher: |
Springer London, London |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 20 found articles
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