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  An Accurate Characterization of CRT Monitor (II) Proposal for an Extension to CIE Method and Its Verification
 
 
Title: An Accurate Characterization of CRT Monitor (II) Proposal for an Extension to CIE Method and Its Verification
Author: Katoh, Naoya
Deguchi, Tatsuya
Berns, Roy S.
Appeared in: Optical review
Paging: Volume 8 (2001) nr. 5 pages 397-408
Year: 2001
Contents:
Publisher: Springer-Verlag, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 19 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands