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Journal description
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Details for article 5 of 21 found articles
| Title: |
Efficient phase matching algorithm for measurements of ultrathin indium tin oxide film thickness in white light interferometry |
| Author: |
Chen, Kai Lei, Feng Itoh, Masahide |
| Appeared in: |
Optical review |
| Paging: | Volume 24 (2017) nr. 2 pages 121-127 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer Japan, Tokyo |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 21 found articles
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