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                                       Details for article 4 of 21 found articles
 
 
  Frequency scanning interferometry immune to length drift using a pair of vertical-cavity surface-emitting laser diodes
 
 
Title: Frequency scanning interferometry immune to length drift using a pair of vertical-cavity surface-emitting laser diodes
Author: Kakuma, Seiichi
Katase, Yasuhiko
Appeared in: Optical review
Paging: Volume 19 (2012) nr. 6 pages 376-380
Year: 2012
Contents:
Publisher: Optical Society of Japan, Japan
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 21 found articles
 
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