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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 14 of 15 found articles
| Title: |
Thickness and Surface Profile Measurement by a Sinusoidal Wavelength-Scanning Interferometer |
| Author: |
Akiyama, Hisashi Sasaki, Osami Suzuki, Takamasa |
| Appeared in: |
Optical review |
| Paging: | Volume 12 (2005) nr. 4 pages 319-323 |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 15 found articles
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