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                                       Details for article 19 of 32 found articles
 
 
  Improved Uncertainty of Optical Frequency Domain Reflectometry Based Length Measurement by Linearizing the Frequency Chirping of a Laser Diode
 
 
Title: Improved Uncertainty of Optical Frequency Domain Reflectometry Based Length Measurement by Linearizing the Frequency Chirping of a Laser Diode
Author: Kakuma, Seiichi
Ohmura, Kohhei
Ohba, Ryoji
Appeared in: Optical review
Paging: Volume 10 (2003) nr. 4 pages 182-184
Year: 2003
Contents:
Publisher: Springer-Verlag, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 19 of 32 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands