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Journal description
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Details for article 1 of 27 found articles
| Title: |
A MS-Windows simulation tool for synchrotron X-ray exposure and subsequent development |
| Author: |
Meyer, P. Cremers, C. El-Kholi, A. Haller, D. Schulz, J. Hahn, L. Megtert, S. |
| Appeared in: |
Microsystem technologies |
| Paging: | Volume 9 (2002) nr. 1-2 pages 104-108 |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 27 found articles
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