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                                       Details for article 51 of 52 found articles
 
 
  Wafer bonding using Cu–Sn intermetallic bonding layers
 
 
Title: Wafer bonding using Cu–Sn intermetallic bonding layers
Author: Flötgen, C.
Pawlak, M.
Pabo, E.
Wiel, H. J. van de
Hayes, G. R.
Dragoi, V.
Appeared in: Microsystem technologies
Paging: Volume 20 (2013) nr. 4-5 pages 653-662
Year: 2013
Contents:
Publisher: Springer Berlin Heidelberg, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 51 of 52 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands