Characterization method for new resist formulations for HAR patterns made by X-ray lithography
Titel:
Characterization method for new resist formulations for HAR patterns made by X-ray lithography
Auteur:
Kunka, Danays Mohr, Jürgen Nazmov, Vladimir Meiser, Jan Meyer, Pascal Amberger, Maximilian Koch, Frieder Schulz, Joachim Walter, Marco Duttenhofer, Thomas Voigt, Anja Ahrens, Gisela Grützner, Gabi