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                                       Details for article 5 of 5 found articles
 
 
  Three-stage confidence intervals for a linear combination of locations of two negative exponential distributions
 
 
Title: Three-stage confidence intervals for a linear combination of locations of two negative exponential distributions
Author: Isogai, Eiichi
Uno, Chikara
Appeared in: Metrika
Paging: Volume 81 (2017) nr. 1 pages 85-103
Year: 2017
Contents:
Publisher: Springer Berlin Heidelberg, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 5 found articles
 
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