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Details for article 1 of 8 found articles
| Title: |
A generalized correlated binomial distribution with application in multiple testing problems |
| Author: |
Gupta, Ramesh C. Tao, Hui |
| Appeared in: |
Metrika |
| Paging: | Volume 71 (2008) nr. 1 pages 59-77 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 8 found articles
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