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                                       Details for article 8 of 10 found articles
 
 
  Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence
 
 
Title: Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence
Author: Sokolov, V. I.
Pustovarov, V. A.
Churmanov, V. N.
Ivanov, V. Yu.
Gruzdev, N. B.
Sokolov, P. S.
Baranov, A. N.
Moskvin, A. S.
Appeared in: JETP letters online
Paging: Volume 95 (2012) nr. 10 pages 528-533
Year: 2012
Contents:
Publisher: SP MAIK Nauka/Interperiodica, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 10 found articles
 
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