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                                       Details for article 10 of 12 found articles
 
 
  Shot noise measurements in a wide-channel transistor near pinch-off
 
 
Title: Shot noise measurements in a wide-channel transistor near pinch-off
Author: Khrapai, V. S.
Shovkun, D. V.
Appeared in: JETP letters online
Paging: Volume 92 (2010) nr. 7 pages 460-465
Year: 2010
Contents:
Publisher: SP MAIK Nauka/Interperiodica, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 12 found articles
 
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