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Details for article 1 of 8 found articles
| Title: |
Bias voltage dependent shift of the atomic-scale structure of a Ge(111)-(2 × 1) reconstructed surface measured by low temperature scanning tunneling microscopy |
| Author: |
Arseyev, P. I. Maslova, N. S. Panov, V. I. Savinov, S. V. Haesendonck, C. Van |
| Appeared in: |
JETP letters online |
| Paging: | Volume 85 (2007) nr. 6 pages 277-282 |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Nauka/Interperiodica, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 8 found articles
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