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  Angular distribution of diffracted x rays from (111) channeled electrons in Si: The effect of the band structure of energy levels
 
 
Title: Angular distribution of diffracted x rays from (111) channeled electrons in Si: The effect of the band structure of energy levels
Author: Bogdanov, O. V.
Korotchenko, K. B.
Pivovarov, Yu. L.
Appeared in: JETP letters online
Paging: Volume 85 (2007) nr. 11 pages 555-559
Year: 2007
Contents:
Publisher: Nauka/Interperiodica, Moscow
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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