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                                       Details for article 9 of 15 found articles
 
 
  Observation of antiphase domains in CdxHg1−xTe films on silicon by the phase contrast method in atomic force microscopy
 
 
Title: Observation of antiphase domains in CdxHg1−xTe films on silicon by the phase contrast method in atomic force microscopy
Author: Sabinina, I. V.
Gutakovskii, A. K.
Sidorov, Yu. G.
Yakushev, M. V.
Varavin, V. S.
Latyshev, A. V.
Appeared in: JETP letters online
Paging: Volume 82 (2005) nr. 5 pages 292-296
Year: 2005
Contents:
Publisher: Nauka/Interperiodica, Moscow
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 15 found articles
 
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